Live imaging of electromigration

People Involved

Thiti Taychatanapat, Kirill Bolotin, Ferdinand Kuemmeth


In order to obtain better control over the properties of junctions, we have developed a technique to image the process of electromigration live in the SEM chamber.

The voltage across the junction is ramped up slowly until the junction fails, producing a nanometer-size gap. Frames below illustrate the breaking process at different times. You can view the entire clip (4.4 MB).

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We have also imaged electromigration of gold wires under a variety of different conditions. You can view the clips here:

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