Live imaging of electromigration

People Involved

Thiti Taychatanapat, Kirill Bolotin, Ferdinand Kuemmeth

Summary

In order to obtain better control over the properties of junctions, we have developed a technique to image the process of electromigration live in the SEM chamber.

The voltage across the junction is ramped up slowly until the junction fails, producing a nanometer-size gap. Frames below illustrate the breaking process at different times. You can view the entire clip (4.4 MB).

sorry Netscape users this don't work see main text

We have also imaged electromigration of gold wires under a variety of different conditions. You can view the clips here:

contact info